Integrated Nanomanufacturing and Nanoinformatics for Quality Improvement

Unlike traditional manufacturing, nanomanufacturing (NM) involves product characteristics and process variables at multiple feature scales. However, control of the multiscale process/product variations (MPVs) in NM is constrained by the scarcity of measurement data, a lack of observation during processing, and limited physical knowledge. The article argues that NM and nanoinformatics should be integrated together to address the challenge of MPVs for quality and productivity improvement. We review the works in this new field and illustrate examples of integrated NM and nanoinformatics (INN) research. Finally we will discuss the potential major issues to be addressed in INN.